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MVL Multi-Scanner System

BinMaster Level Controls May 23, 2011

Designed for very wide, large bins (such as 105' diameter bins) the multiple scanner system integrates the multiple point measurement data from two or more 3DLevelScanners to cover a very wide surface area and provide inventory volume with greater accuracy than any single point measurement device. Using advanced processing and software, the MVL also displays a visual representation of the material surface that shows high and low points in the bin such as cone up, cone down, sidewall buildup or bridging.

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