MVL Multi-Scanner System

Designed for very wide, large bins (such as 105' diameter bins) the multiple scanner system integrates the multiple point measurement data from two or more 3DLevelScanners to cover a very wide surface area and provide inventory volume with greater accuracy than any single point measurement device. Using advanced processing and software, the MVL also displays a visual representation of the material surface that shows high and low points in the bin such as cone up, cone down, sidewall buildup or bridging.